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"I had taken it for granted that broken probes and gouges on the chip were part of life for chip testing, but the cascade probes eliminate both of them."
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Cascade Microtech offers more than 50 different analytical probe models for wafer, package, and board level characterization. We offer RF, microwave and millimeter-wave probes in the Infinity Probe®, T-Wave Probe™, Air Coplanar Probe and |Z| Probe® families, as well as probes for DC parametric test and failure analysis.
- Air Coplanar (ACP) Family
- Infinity Family
- T-Wave Probe Family
- |Z| Probe Family
Durable, high-performance multi-contact (wedge) probes streamline RFIC engineering test. [View more]
To provide highly accurate characterization of RF power devices at wafer level, the |Z| Probe® Power, based off proven |Z| Probe technology, handles high power at high frequencies (up to 40 GHz). The |Z| Probe Power provides excellent contact repeatability and extremely low contact resistance to deliver accurate results in load-pull measurement setups, which are typical for characterizing RF power devices. [View more]
Cascade Microtech's power device probes provide a complete on-wafer solution for over-temperature, low-contact resistance measurements of power seimconductors up to 60A and 3000V. [View more]
Cascade Microtech’s DC probes deliver highly accurate measurements for advanced on-wafer process, device characterization and reliability testing. Our probes offer superior guarding and shielding over-temperature to resolve the performance limitations of non-coaxial and standard coaxial probes. [View more]
Cascade Microtech offers precision, durable fine pitch probes, ideal for signal integrity probing on IC packages and circuit boards. [View more]
The LWP probe can illuminate and collect optical signals used in the characterization of a variety of photonic devices. When combined with Cascade Microtech’s probe stations, and RF and DC probes, the LWP probe can provide modulation, spectral, time domain and low-level DC/CV measurements. [View more]
Cascade Microtech designs and builds a wide variety of custom and specialty probes. If you are unable to find a probe that meets your needs on our website, please contact us and we will be happy to discuss specific requirements for your application. [View more]
Our families of calibration substrates supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector network analyzers. [View more]