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300mm Probe Stations


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Cascade Microtech 300 mm probing solutions set the standard for on-wafer test, delivering the precision and versatility needed to address a wide range of advanced, complex testing requirements.

CM300xi Probe System

CM300xi - Fully Automatic Probe System

Cascade Microtech’s CM300xi with Contact Intelligence technology meets the measurement challenges brought on by extremely complex environments, such as unattended test at multiple temperatures. The CM300xi provides the lab automation capabilities needed to make critical precision electrical measurements for device characterization, high-volume engineering and extremely challenging applications. With renowned Cascade Microtech precision measurement expertise, you can confidently deliver accurate and reliable data for current and evolving device technologies [View more]

PM300: Precise & Stable 300 mm Probing


The PM300 manual probe station is ideal for manual semiconductor failure analysis and in-process testing. Its versatility meets a wide range of probing applications

Wafer size: ≤ 300 mm
Main Applications: DCM, FA [View more]

PA300 Semi-automatic Probe System

PA300 Semiautomatic Probe System

For a complete wafer-level test solution, the PA300 can be configured with a vast array of accessories to meet your testing requirements.

Wafer size: ≤ 300 mm
Main Applications: DCM, FA [View more]