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30x50umパッド��高精度プロービング

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JSAP理化学・計測機材展
http://www.jsap.or.jp/
プローブ修理サービス

カスケード・マイクロテックは、InfinityやACPなどの高周波プローブの修理サービスを提供します。 詳細

Addressing the Challenges of Small Pad Probing

Smaller pads not only utilize less device real estate, they also allow sacrificial test structures to be placed in scribe lines, meaning process control monitoring and device characterization can be performed without using valuable space for sellable circuits. Probing pads with large dimensions is relatively simple with conventional probe technologies.

A conventional probe mark compared to an InfinityQuad probe mark using a similar scale.
However, when trying to probe pad sizes of 50 um x 50 um or less, side skate becomes a challenge as it causes wider probe marks and can change the probe pitch with overtravel. Read how InfinityQuad solves this and other challenges of probing small pads.

Tech Brief: Addressing the Challenges of Small Pad Probing


LED Test- Challenges for Equipment Manufacturers

LED Test-TMW_September_2010 CoverAs markets for display backlighting and solid-state lighting grow, equipment vendors adapt to meet the needs of a rapidly changing industry. New equipment must accommodate the range of test configurations found across the spectrum of manufacturers. At the same time, the equipment must keep the cost of test low to help reduce the overall cost of LEDs and contribute to the successful adoption of LED technology in consumer applications.

Cascade Microtech Japan – Status After Tohoku Earthquake

この度の東北地方太平洋沖地震により被災された皆様に心よりお見舞い申し上げます。弊社は被災されたお客様に最善を尽くしサポートすべく、平常通りに営業しております。お困りになっている事がございましたら、どうぞお気兼ねなく、電話、email等にてお問い合わせください。Read more ...

New InfinityQuad™ for Highly Accurate Small Pad Probing

InfinityQuad is the only multi-contact quadrant probe capable of automated over temperature measurement on pads as small as 30 µm x 50 µm. For repeatable and precise engineering tests of DC, logic, RF and mmWave RFIC devices, the InfinityQuad probe ensures reliable measurement results up to 110 GHz over a wide temperature range (-40 °C to 125 °C). The durable probe tips with small contact area of ~10 μm diameter ensure more than 250,000 touchdowns on Al pads, and provide accurate X, Y and Z alignment. Customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic. Read more ...

Cascade Microtech Partners With imec for 3D-TSV Probe Solutions

Cascade Microtech, Inc., a leading expert at enabling precision measurements of integrated circuits at the wafer level, and the nanoelectronics research center imec, today announced they have entered into a collaborative research partnership for testing and characterization of 3D integrated circuit (IC) test structures. Imec will work closely with Cascade Microtech to develop test methods and methodologies for emerging 3D Through-Silicon-Via (TSV) structures, and to lead the way in development of global standards for 3D IC development and production test. Read more ...

New Features Added to WinCalXE Calibration Software

WinCalXE 4.5 is a single software tool that contains the valuable features of both WinCalXE and SussCal®, and operates with all manual and semi-automatic Cascade Microtech and former SUSS MicroTec probe stations. WinCalXE 4.5 contains advanced calibration methods, including LRRM and a new LRM+ calibration algorithm.
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