Estrada Integrated Wafer-Level Reliability Test System
The Estrada™ product line offers fully-integrated high-throughput test cell packages for wafer-level reliability (WLR) test. It provides a smooth pathway toward accelerated reliability assessments and process qualifications on 300 mm wafer processes. This comprehensive WLR test cell is optimized for high-volume intrinsic reliability testing and is ready to use as soon as the system arrives at your test site. With several pre-validated configurations available, specifying and deploying a highly-capable test system has never been easier or quicker – no time is wasted searching for various equipment pieces and myriad options from multiple vendors, evaluating their suitability and compatibility, writing software, setting up the system, or worrying about support.
The Estrada-EM turnkey wafer-level reliability (WLR) test system for electromigration (EM) is designed specifically to meet the unique challenges of EM WLR. Its PureZone™ technology provides very high temperatures while preventing copper oxidation.
- Best-in-class WLR tools and components integrated as a fully-functional test cell, including reliability instruments, probe cards, test executive software and analytical probers
- Guaranteed, pre-validated system configuration for faster time to first data
- Maximum data output with high parallel DUT capacity, full-wafer/multi-site probing and automation to step across wafer