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RF Microwave Probes

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Contact us at 1-800-550-3279 (1-503-601-1000) or complete our sales inquiry form. View more

Customers are saying...

"I had taken it for granted that broken probes and gouges on the chip were part of life for chip testing, but the cascade probes eliminate both of them."

Publication Library

Browse brochures, data sheets, application notes, white papers and related files. View more

Probe Selection Guide

Cascade Microtech offers a wide selection of engineering probes designed to meet the many challenges of various probing environments. View our Probe Selection Guide for more information,

Probe Repair

Protect your probe investment and lower your cost-of-ownership. Cascade Microtech's probe repair program makes it easy to get started. View more

Probes Support

Find service and support information for your Infinity™, ACP, Unity™, EyePass™ DCP100, DCP-HTR, HCP, HVP, Fixed Pitch, and other engineering probes View more

Cascade Microtech created the first microwave probe in 1983 that enabled the first on-wafer 18 GHz measurements and accelerated the commercialization of gallium arsenide chips. Our line of RF probes is designed to meet the challenges of high-frequency probing and ensures low and stable contact resistance on aluminum pads.

Air Coplanar Probe

ACP Probe

The Air Coplanar Probe is a rugged microwave probe with a compliant tip for accurate, repeatable measurements on-wafer. It features excellent probe-tip visibility and the lowest loss available. Available as both single and dual, the ACP probe combines outstanding electrical performance with precise probe mechanics and is todays most widely used microwave probe available. [View more]

Infinity Probe®

Infinity Probe

Ideal for device characterization and modeling, Infinity probe combines extremely low contact resistance on aluminum pads with unsurpassed RF measurement accuracy for highly reliable, repeatable measurements. Proprietary thin-film and coaxial probe technology reduces unwanted couplings to nearby devices and transmission modes. [View more]

T-Wave Probe

T-Wave Probe

The T-Wave Probes enable wafer-level electrical measurement of mmW devices and materials up to 1.1 THz and deliver low insertion loss and low contact resistance when probing gold pads. [View more]

|Z| Probe®

|Z| Probe

The |Z| Probe® patented technology assures high-accuracy measurements with low contact resistance and superior impedance control. The RF/Microwave signal makes only one transition to the coplanar contact structure within the shielded, air-isolated probe body maintaining signal integrity over a temperature range from 10 K to 300°C. [View more]