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200mm Probe Stations

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Probe Systems Planning

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MeasureOne

Cascade Microtech’s industry standard 200 mm wafer probing systems are in use at virtually all leading semiconductor manufacturing and design sites worldwide. They have been designed to allow access to the full measurement range of today’s most advanced test instrumentation. Whatever the application - device characterization, modeling, process development, design de-bug or IC failure analysis, Cascade Microtech probing systems have the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices.

PM8 Manual Probe System

PM8

The PM8 probe system is the benchmark for manual failure analysis and in-process testing. This modular system meets customers' needs for precision, reliability and cost of ownership. [View more]

Summit Semi-automated Probe System

The Summit series 200 mm semi-automated probe systems lead the industry in on-wafer measurements. Whatever your application: RF/Microwave, device characterization, wafer-level reliability, e-test, modeling or yield enhancement, the Summit meets your unique wafer probing test requirements. [View more]

PA200 Semi-automatic Probe System

PA200 Semiautomatic Probe System

The PA200 semi-automatic probe station relies on precision engineering to provide a stable environment for the most exacting applications. [View more]

BlueRay Production Probe Systems

BlueRay™ Probe System

The BlueRay™ production probe systems ensure accurate and repeatable test results for wafer-level functional test of discrete devices. The PA200 BlueRay semi-automatic probe system can be easily upgraded in the field to a fully-automatic system by simply docking a wafer-handling robot. [View more]