For engineering lab and production customers who need quick access to the best products to meet their test and measurement requirements, MeasureOne is a unique commitment between Cascade Microtech and a select group of partners to deliver optimized solutions to address customers' applications. Cascade Microtech and its MeasureOne partners work together to configure and install solutions with validated performance and post-installation service and support.


1/f Device Characterization

A Fully Integrated 1/f Device Characterization System. Guaranteed.

Getting the best out of a test cell confi gurator for 1/f measurements can be challenging. There are many outside sources of interference that can degrade and spoil the sensitive measurements. The starting point of any comprehensive solution is to use a well-known and pre-validated configuration. This ensures that all components are included to make the best possible measurement. When sourcing instruments, probes and a probe station from different suppliers, the final configured test cell may not adequately address your specific measurement challenges.

1/f Device Characterization


Circuit Characterization

A Fully Integrated Wafer-level Circuit Characterization System. Guaranteed.

The specification of a test system to perform wafer-level measurements on circuits such as amplifiers, mixers and filters can be challenging, especially when a single wafer can include multiple circuit types. The tests required to validate these structures are wide-ranging and complex, including S-parameters, DC-parameters, noise figure, gain compression and intermodulation distortion. Measurement and calibration accuracy is critical, especially where testing must be correlated between multiple locations.

Circuit Characterization


Cryogenic/Magnetic Probing

Probing under Extreme Temperature and Magnetic Field Conditions

Ongoing advances in the physical sciences are creating new generations of semiconductor and magnetic materials in response to the needs for higher speed, greater capacity, reduced power, and increased performance. Early stage research starts by subjecting sample materials to extremely low cryogenic temperatures (within a few degrees of absolute zero) in order to measure fundamental electrical transport properties. Materials with magnetic characteristics will simultaneously be exposed to high fields as these measurements are taken. Thus, materials R&D labs need test and measurement systems with the ability to manifest these extreme sample environments.

Cascade Microtech now combines its 30-plus years of precision electrical and mechanical measurement experience with Lake Shore Cryotronics' unparalleled expertise in device characterization under extreme temperature and magnetic field conditions. Taken together, our products, services, and technologies give you a complete range of measurement solutions all along the spectrum from cryogenic/magnetic materials science to automated probing of production-ready devices.

Cryogenic/Magnetic Probing


S-Parameter & DC Parametric Device Characterization

Building blocks for wafer-level device characterization

The configuration of a device characterization system can be challenging; equipment must be sourced from multiple suppliers and then configured and proven on-site before your first device can be tested. You must integrate all the measurement equipment, wafer probers, and other components, each with its own firmware or software control, and ensure that there is data correlation and measurement accuracy between different locations. It can take weeks, or even months, before you can execute your first measurements. Cascade Microtech, with MeasureOne partner Keysight Technologies, address these challenges directly by providing a fully integrated wafer-level measurement solution with guaranteed system configuration, installation and support.

S-Parameter & DC Parametric


Terahertz Probing

Robust, Calibrated Measurement at Frequencies from 140 GHz to 1.1 THz.

Robust, calibrated on-wafer measurements of planar millimeter and sub-millimeter wave devices significantly reduce the effort required to characterize a wafer of devices while increasing the accuracy of the measurement by eliminating errors and effects associated with fixtures. Working with Dominion MicroProbes, Inc. we offer a MeasureOne solution for Terahertz probing that assures optimized performance and full integration with Cascade Microtech 150 mm, 200 mm and 300 mm probe systems.

Under the MeasureOne collaboration with DMPI, the partnership will provide millimeter and sub-millimeter wavelength on-wafer ground-signal-ground probes and associated components for electrical measurement of devices and materials with frequencies of 140 GHz to 1.1 THz. DMPI products will be validated on Cascade Microtech’s EPS150mmW manual probe station, as well as the Summit 200 mm and Elite 300 mm on-wafer probe systems.

Terahertz Probing