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Conferences and Events


May 26, 2017 9:00 AM PST - May 26, 2017 7:00 PM PST


High Parallelism Probe Card on V93000 Direct Dock System to Increase Testing Throughput on Automotive ICs

Alan Liao, Manager, Product Marketing, FormFactor, Inc.

As automotive IC fabrication transitions to sub-40nm processes on 12-inch wafers, customers are exploring more efficient test solutions to accommodate the increased number of die per wafer. FormFactor and Advantest have collaborated to enable parallel testing of up to 128 DUTs over a 170C temperature range, using FormFactor's TrueScale Matrix probe cards on the Advantest V93000 direct dock system

Location:Intercontinental Shanghai Pudong (May 26)

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