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Conferences and Events

Company

June 5, 2017 - June 6, 2017

Semiconductor Wafer Test Workshop (SWTW)

Attend SWTW Technical Sessions:

MONDAY, JUNE 5TH | 1:30–2:00
Hybrid MEMS Probe Design to Maximize Electrical & Mechanical Wafer Test Performance

TUESDAY, JUNE 6TH | 2:30–3:00
Fully-Automated Test System for Characterizing Wide-I/O Micro-Bump Probe Cards

WEDNESDAY, JUNE 7TH | 8:30–9:00
Evaluation of RF Calibration Substrate Lifetime and Accuracy for mW Production Test Cells

WEDNESDAY, JUNE 7TH | 9:30 – 10:00
Katana RF: A New Technology for Testing High-Speed RF Applications within Texas Instruments

WEDNESDAY, JUNE 7TH | 10:30–11:00
Verification of Singulated HBM2 Stacks with Die Level Handler

MEET OUR SPEAKERS IN BOOTH #4 ON THE EXPO FLOOR.


Join us for an evening of casual networking and discussions:

WHEN: Tuesday, June 6th | 9:00 PM
WHERE: Castillo Suite | Building 600 | Vista Building
For more information, contact Kelly Richards (krichards@formfactor.com).



Location:Rancho Bernardo Inn, San Diego, CA
Booth:4

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