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Conferences and Events


March 14, 2017 - March 16, 2017


FormFactor and Cascade Microtech will showcase:

  • Production probe cards for DRAM, Flash and SoCs
  • World’s first on-wafer full-thermal measurement at 330 GHz
  • EPS150 application-focused probing solutions for DC parametric, I-V/C-V, FA, RF/mmW/THz and high-power applications
  • Automated high-power device test solution at full thermal range
  • Estrada-EM wafer-level reliability (WLR) test system for electromigration (EM)
  • Industry’s largest selection of engineering probes, from DC to THz

Location:Shanghai New International Expo Center, Shanghai, China
Booth:Hall 2, Booth# 2343

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