Category Archives: Probe Maintenance

Which Probe Tip Calibration is Best for Active Device Characterization?

Are you looking for an accurate, consistent and easy to implement probe tip calibration method for characterization of advanced high-performance active devices? We evaluated three calibration methods:… [View More]

The Strengths and Weaknesses of On-Wafer Calibration Methods

There are various on-wafer calibration methods, each with its own set of strengths and weaknesses. Here are four typical calibrations: 1. SOLT – Short Open Load Thru – a robust calibration… [View More]

Online Abrasive Cleaning Methods for Pyramid Probe Cards

The cleaning frequency and intensity needed to keep a Pyramid Probe® operating at its best are related to the probing environment itself. Therefore, the exact formula for cleaning Pyramid Probes m… [View More]