800-550-3279 ::  503-601-1000  ::  Log On  ::  日本語

Elite 300 Probe Station

Products

The Next Step in 300mm Probing

The Elite 300 sets the new standard in 300mm probing. In step with the ITRS roadmap at 45nm and below, the Elite 300 overcomes measurement challenges brought on by increased device complexity, smaller pad sizes, and lower voltages. The Elite 300 delivers unprecedented stepping accuracy and wafer planarity over the full temperature range. It also provides the world's lowest-noise "Quiet" environment, and ensures low-leakage, low-capacitance measurements.

Problems Solved: Accurate Measurements in Complex Environments
Challenge Advanced Stage Thermal System Pureline/ MicroChamber Rigid Architecture Automation
Small-Pad Probing Layout - Blue Dot Layout - Blue Dot   Layout - Blue Dot Layout - Blue Dot
Thermal Measurements   Layout - Blue Dot Layout - Blue Dot   Layout - Blue Dot
Low-Noise Measurements Layout - Blue Dot Layout - Blue Dot Layout - Blue Dot    
Multi-Site Testing   Layout - Blue Dot   Layout - Blue Dot Layout - Blue Dot
Internal-Node Probing       Layout - Blue Dot Layout - Blue Dot
Which Station is Right for My Application?
Application Elite 300/AP Elite 300/M
Parametric Gm,Vth Layout - Blue Dot Layout - Lt Blue Dot
Ig, Id off Layout - Blue Dot Layout - Lt Blue Dot
Cox, C-V Layout - Blue Dot Layout - Lt Blue Dot
1/f Layout - Blue Dot  
RF Gain, Power   Layout - Lt Blue Dot
NF, NP Layout - Blue Dot Layout - Lt Blue Dot
mmW Layout - Blue Dot Layout - Lt Blue Dot
multi-port   Layout - Lt Blue Dot
WLR EM Layout - Lt Blue Dot Layout - Blue Dot
TDDB Layout - Lt Blue Dot Layout - Blue Dot
NBTI Layout - Lt Blue Dot Layout - Blue Dot
HCI Layout - Lt Blue Dot Layout - Blue Dot
FA/DD Internal node   Layout - Blue Dot
EM   Layout - Blue Dot
Laser   Layout - Blue Dot
Sub-micron   Layout - Blue Dot
Layout - Blue Dot = Recommended   Layout - Lt Blue Dot = Compatible