PA200 Semi-automatic Probe System
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200mm Semi-automatic Testing at Its Best
The PA200 semi-automatic probe station relies on precision engineering to provide a stable environment for the most exacting applications. Due to the high stability and accuracy of the probe station, the PA200 is ideal for failure analysis, device characterization and modeling of devices from DC to RF/microwave. Additionally, your results are guaranteed to be accurate for engineering test of optoelectronic and MEMS devices using the PA200 prober.
The industry-leading ProberBench™ Operating Environment provides an intuitive, user-friendly interface and powerful options to maximize the effectiveness of the probe system.
Features and Benefits
- Most precise 200 mm probe system
- Ideal for failure analysis and device characterization and modeling (DC to RF/microwave)
- Submicron probing capability
- Intuitive, user-friendly control system
- Vast array of accessories for a complete, customized test solution