Integrated Measurement Systems
Optimized Systems solve complex measurement challenges
Integrated systems from Cascade Microtech provide a complete solution for complex measurement problems that cannot be solved with just a collection of piece parts. Each part of the integrated solution is optimized and fine tuned to work together, enabling fast accurate on-wafer data collection for complex application and measurement needs. Integrated Systems are build upon high performance Cascade Microtech probe stations, giving you the ease of use and full featured on-wafer probing experience that has made Cascade Probe Station's the #1 choice of customer throughout the world. And each turnkey solution includes everything you need in one system, including a variety of highly optimized on-wafer probes, test instrumentation & cabling configurations, and software tools, ready to go.
EDGE: Fully Integrated Flicker Noise Measurement System
The EDGE™ Flicker Noise Measurement System is the world’s only fully integrated, noise-immune measurement system that certifies accurate flicker noise measurements from 1 Hz to 30 MHz. The EDGE delivers new levels of certainty to companies that must continue to improve device performance, increase yield, command higher margins and reduce time to market. View more ...
Tesla: On-Wafer Power Device Characterization System
Tesla is the industry’s first complete system for on-wafer power device characterization. Now power device manufacturers can take advantage of a complete on-wafer solution for over temperature, low-contact resistance measurements of power devices up to 60A and 3000V. Tesla is here to help power device manufacturers meet and beat the extraordinary pace of the global marketplace. View more ...
L-Series Microfluidics Systems
The L-Series microfluidics measurement systems from Cascade Microtech provide a convenient and repeatable work space for microfluidic assays. Scaleable from an affordable, entry-level to a high precision system; the L-Series provides researchers and scientists with the maximum level of flexibility for running microfluidic experiments. View more ...
