RFIC & Functional Test Probes
Cascade Microtech's durable, high-performance multi-contact probes streamline RFIC engineering test.
Unity Probe ™: Multicontact probe for RFIC engineering test
The Unity probe is well-suited for on-wafer circuit measurements for engineering design debug and verification. This build-to-order multicontact probe streamlines RFIC engineering test, saving you time, aggravation and money. An online design capture and request for quote form is available. View more ...
Eye-Pass Multicontact DC Probe
The multicontact Eye-Pass probe provides controlled impedance power connections enabling functional testing of even the most challenging circuits on-wafer. The high-durability composite multi-finger tip provides high compliance and ensures precise alignment. This custom probe allows the user to select the footprint pattern best suited for the application, with up to 12 contacts per probe head. View more ...
Multicontact DC Power Probe Series
Multi-contact DC power probes were developed in response to the need for multiple probe tips in a single probe head. The DCQ probes use controlled impedance, ceramic blade needles for low noise and high performance. This needle style allows the placement of high quality bypass capacitors with very little series inductance due to their close proximity to the probe tip. All of the needles are connected to a common ground plane but individual needles can be easily (ground) isolated for additional low noise performance. View more ...
RF Quadrant Probes
Quadrant Probes were developed in response to the need for multiple probe tips in a single module. Configurations consist of all RF or a combination of RF and DC. The RF probes use Air Coplanar technology to produce a rugged microwave probe with a compliant tip for accurate, repeatable measurements on-wafer. The DC probes use ceramic blade needles for low noise and high performance. View more ...
