Multi-port/Differential Probing

The use of differential device architecture is becoming increasingly common in a wide range of RF applications.  Cascade Microtech’s turnkey solutions enable on-wafer characterization of multiport or balanced devices and circuits.  They include Cascade Microtech’s probe stations, dual probes, differential ISS, and calibration software with advanced 4-port calibration algorythms.

ProblemsSolutions
Signal to signal crosstalk on dual probesInfinity Dual probes with superior field confinement and low coupling
Corrected multi-channel phaseWinCal XE calibration software and differential ISS
Achieving a probing tolerant 4-port calibrationWinCal XE's exclusive advanced 4-port hybrid LRRM-SOLR calibrations

Related Web Pages
Dual Infinity Probe
Air Coplanar Probe Series
WinCal XE Software
Impedance Standard Substrates
Radio Frequency (RF) Probe Positioners
Cables
Summit 11000/12000 Probe Stations
M150 Measurement Platform
Elite 300 Station Platform
eVue Digital Imaging System

Related Files
Making Accurate and Reliable 4-port On-Wafer Measurement
Solve complexity issues in 4-port RF designs
A High Isolation Dual Signal Probe Technology
Optimized Impedance Standard Substrate Designs for Dual and Differential Applications
A Hybrid Probe-Tip Calibration for Multiport Vector Network Analyzers