Nucleus: Probe Station Control Software
Cascade Microtech Nucleus software enhances your test investment by providing quick results in a flexible and integrated environment. Each wafer test step from loading and aligning, creating wafer maps, collecting test data, and analyzing results has been carefully crafted to optimize your time spent taking measurements.
Applications
- RF Measurement applications are made simpler by these features in Nucleus:
- Programmable buttons for moving to the auxiliary chucks for contacting standards.
- Contact zones that protect the probe tips when moving from the wafer to the auxiliary chucks.
- DC characterization applications can take advantage of these features.
- Control of the thermal chuck and automatic compensation for thermal expansion.
- Test result monitoring displayed in real time on the wafer map.
Advantages
- Quick wafer test setup with the software wizards for creating wafer maps, sub-sites on die, and aligning the wafer.
- Instant graphical feedback of your test results. If your tests go bad because of dirt on a probe tip, you will be able to stop the test before more time is wasted.
- Remote programming is simplified – your custom test software is easier to debug.
- Graphical sub-site window for creating multiple test locations within a die.
- Vision – Pattern recognition for die stepping alignment.
- AutoProbe – Precision control of the motorized microscope and positioners.
- Thermal – Control of the thermal chuck temperature and automatic compensation for thermal expansion.
