Product Portfolio

Engineering Probes

Cascade Microtech offers more than 50 different analytical probe models for wafer, package, and board level characterization. We offer RF microwave probes in the Infinity and Air Coplanar Series, DCPs for DC test and PE5s for failure analysis. Our probes support a broad range of probing uses at frequencies up to 220 GHz. View more ...

Pyramid Probe Cards: Superior electrical and mechanical performance

Pyramid Probe cards are rugged, robust, and well suited for the rigors of high-performance production wafer sort. Its industry leading signal integrity and mechanical alignment capabilities make these probe cards the perfect fit for multi-die testing for RF wireless, high-speed digital in SiPs, SoCs, and leading edge DC and RF Parametric testing. View more ...

Gryphics Sockets: High performance sockets and contactors

Gryphics specializes in medium to high-volume, high-density, small-pitch, Gigahertz interconnection systems for various electronic industries. Our emphasis is on product innovation for customer applications where edge rates are fast, space is limited, reliability demands are high and cost sensitivity is critical. View more ...

Integrated Measurement Systems

Integrated systems from Cascade Microtech provide a complete solution for complex measurement problems that cannot be solved with just a collection of piece parts. Each part of the integrated solution is optimized and fine tuned to work together, enabling fast accurate on-wafer data collection for complex application and measurement needs. View more ...

Probe Stations

Whether you need a cost-effective manual station for probing 150mm wafers or a semiautomatic thermal station to probe 200mm or 300mm wafers, Cascade Microtech offers a complete line of high performance solutions for on-wafer probing, circuit boards and modules, MEMS, biological structures, and electro-optic devices. Probe stations are available with accessories such as thermal control systems, special cables, calibration software, and industry leading probes. View more ...

Calibration Tools

WinCal XE enhances RF measurement accuracy and productivity through guided system setup, automatic calibraiton and validation, and other advanced RF measurement related tools. Our family of Impedance Standard Substrates (ISS) supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector network analyzers. View more ...