Operations FAQ
How can I measure probe overtravel on my XYZ-brand probe station?How do I perform VNA calibrations with my Pyramid Probe cards?
How can I set overtravel to optimize the lifetime of Pyramid Probe cores?
How can I measure probe overtravel on my XYZ-brand probe station?
If your probe station doesn't already provide a z-axis position readout, it can be useful to add one. Normally in these cases, the station will provide a platen lift mechanism that allows change between contact and separation positions. Measuring the relative vertical position of the platen after first electrical contact provides good overtravel information.
A general-purpose dial test indicator and suitable base providing 0.5-mil resolution or better works well for overtravel measurements. This type of instrument is used in machine shops and may be obtained from many industrial supply companies.
One source is MSC Industrial Supply Company (1-800-645-7270), which features a variety to choose from in their catalog's Measuring Instruments: Dial Test Indicators and Accessories section. One configuration we have used is a Brown & Sharpe 599-585 base with a BesTesT dial indicator.
How do I perform VNA calibrations with my Pyramid Probe cards?
Pyramid Probe cards may be calibrated just like any standard microwave probe. Do not expect the highest calibration accuracy, since Pyramid Probe cards are primarily aimed at production and functional test and are less suited to high-performance characterization applications.
Follow the appropriate link for further instructions:
How can I set overtravel to optimize the lifetime of Pyramid Probe cores?
The most common method is to establish the overtravel required to make good contact, then add 25 to 50 microns of safety margin. Many operations start new cards with as little overtravel as will work, then allow the probe floor to gradually increase overtravel as required to maintain yields, but not exceed a pre-determined maximum. This maximizes card life and minimizes pad damage.
