Pyramid Probe Cards: Superior electrical and mechanical performance

Production Probe CardsPyramid Probe cards are rugged, robust, and well suited for the rigors of high-performance production wafer sort. Its industry leading signal integrity and mechanical alignment capabilities make these probe cards the perfect fit for multi-die testing for RF wireless, high-speed digital in SiPs, SoCs, and leading edge DC and RF Parametric testing.

 

Probe CardsRF Filter/SwitchesRF WirelessSiP/SoC DC ParametricDC/RF Parametric
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Pyramid Probe Card Technology

Pyramid Probe Card Technology Cascade Microtech has developed our own patented clean-room processes for depositing, lithographic patterning, etching and plating probe structures on flexible substrates that are similar to the processes used in making semiconductor chips. These processes have allowed us to develop Pyramid Probe cores with high frequency electrical connections and probe tips that are close together to address narrow pitch requirements. View more ...

RF P-Series Pyramid Probe Cards

RF P-Series Pyramid Probe Cards RF P-Series Pyramid Probe cards provide superior signal integrity for wireless RF and microwave production test. With the industry-leading Pyramid Plus and Microscrub technologies, the RF P-Series ensures a substantially lower cost of ownership, while delivering superior RF signal integrity in a single solution. View more ...

P30 RF Pyramid Probe Cards

P30 RF Pyramid Probe Cards P30 RF Pyramid Probe card is a superior, cost-effective alternative to coaxial-style RF probe cards, optimized for peripheral pads, 50Ω impedance transmission lines and DC control lines. P30 is designed to ensure your success for the high-volume production test of RF filters and switches used in cell phones, base stations and wireless devices. View more ...

SiP/SoC P-Series Pyramid Probe Cards

SiP/SoC P-Series Pyramid Probe Cards SiP/SoC P-Series Pyramid Probe cards reduce your cost of ownership through enhanced throughput, reduced maintenance and increased yields — enabled by large multi-DUT probe surfaces, permanent probe alignment, superior electrical performance and long life. Designed for both bond-pad and flip-chip bump applications, the SiP/SoC P-Series allows at-speed testing of large-scale ICs at die sort. At-speed die sort reduces scrap and allow shipment of KGD. View more ...

PDC50 DC Parametric Pyramid Probe Cards

PDC50 DC Parametric Pyramid Probe Cards High performance, low cost DC parametric Pyramid probe cards are compatible with Agilent 4070/4080 Series and Keithly S600 Series, enabling the accurate monitoring of 65nm and 45nm parametric test structures. Pyramid Plus technology ensures a low cost of ownership, while delivering superior signal integrity and faster settling time, compared to traditional probe technologies. View more ...

PRF50 RF/DC Parametric Pyramid Probe Cards

PRF50 RF/DC Parametric Pyramid Probe Cards PRF50 RF/DC parametric Pyramid Probe card is compatible with Agilent 4070/4080 and Keithley S600 series, designed to enable the accurate monitoring of 65nm and 45nm parametric test structures. The PRF50 ensures a substantially lower cost of ownership, while delivering superior RF signal integrity and faster DC settling time. It is ideal for applications such as final process development, DC and RF parametric volume production (in-line and end-of-line), and Wafer Acceptance Testing (WAT). View more ...

Pyramid Accel Test Program Debug Fixture

Pyramid Accel Test Program Debug Fixture The Pyramid Accel test program debug fixture addresses the increasingly complex test challenges brought on by today’s SoC and RF devices. It provides a unique capability to reduce time and cost to develop accurate, predictable and reliable production test programs, and reduce overall product time to market by up to 60%. View more ...