QFN40P Production ATE Socket

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Gryphics - QFN - ATE

QFN40P ATE test sockets are designed for QFN style packages that require seamless electrical and mechanical transition from the laboratory to the test floor. The unique contact design provides excellent electronic signal fidelity required for today's demanding analog, linear, RF, Blue tooth, and telecommunication applications. The contact set and frame assembly are designed to minimize valuable PCB real estate allowing for exceptionally close topside decoupling and device placement.

QFN40P Production ATE Socket
FeaturesQFN40P
  • Designed for use with QFN/DFN packages down to 0.4mm pitch
  • High frequency performance at a fraction of competing ATE socket cost
  • Rated for hundreds of thousands of insertions
  • Solderless compression mount
  • Individual contacts or contact set can be replaced
  • Low insertion loss up to 20GHz
  • Current rating 4 A per contact
GPD - QFN40P Spec Sheet Cover
QFN40P Datasheet

Related Web Pages
Test Socket/Contactor Lids

Related Files
QFN40P Datasheet
Test Sockets - Application Guide