LGA Test and Burn In Socket
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LGA50 test sockets ensure successful LGA packaged device testing. LGA50 specifically addresses the demanding high-performance signal integrity requirements for high-frequency component and system-level testing. These high-performance, standardized compression-mount test sockets accommodate a wide range of standard and custom package sizes and I/O counts.
| LGA50 Test and Burn In Test Sockets | |
|---|---|
| Features | LGA50 |
| ![]() LGA Datasheet |
| Related Files |
|---|
| LGA50 Datasheet |
| LGA50 Lid Selection Guide |
| Gryphics Test Sockets - Application Guide |








