PDC50 DC Parametric Pyramid Probe Cards
Cascade Microtech today introduced two new Pyramid® parametric probe cards that allow single-pass high-performance DC and RF measurements and reduce the cost of parametric production test for semiconductors with advanced processes nodes at 65 nm, 45 nm and beyond, These leading-edge probe cards leverage Cascade Microtech’s new Pyramid Plus™ parametric probe card manufacturing technology which provides greater mechanical performance, lower leakage, low contact resistance and lowest inductance to rapidly deliver the most accurate and reliable measurements of ever-smaller process monitoring test structures.
