Elite 300 Station Platform - The Next Step in 300mm Probing

Cascade Microtech Sets New Standard for 300mm Wafer Probing

Cascade Microtech introduced new 300mm wafer probe stations designed to meet the worldwide need for advanced on-wafer measurements for semiconductor devices. The Elite 300 sets a new standard for extremely accurate and reliable 300mm wafer probing for devices with process nodes at 45nm and below.

Related Files
Elite 300 Product Brochure
Elite 300 Dry Demo
Elite 300 Specification Sheet
Elite 300 Accessory Catalog
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