Media Kits
Media Kits include press releases, backgrounder, brochure and datasheet.
EDGE - Flicker Noise Measurement System
The EDGE™ Flicker Noise Measurement System is the world’s only fully integrated, noise-immune measurement system that certifies accurate flicker noise measurements from 1 Hz to 30 MHz. The EDGE delivers new levels of certainty to companies that must continue to improve device performance, increase yield, command higher margins and reduce time to market.
Pyramid P30 RF Filter/Switch Probe Cards
P30 RF Pyramid Probe card is a superior, cost-effective alternative to coaxial-style RF probe cards, optimized for peripheral pads, 50Ω impedance transmission lines and DC control lines. P30 is designed to ensure your success for the high-volume production test of RF filters and switches used in cell phones, base stations and wireless devices.
PDC50 DC Parametric Pyramid Probe Cards
High performance, low cost DC parametric Pyramid probe cards are compatible with Agilent 4070/4080 Series and Keithly S600 Series, enabling the accurate monitoring of 65nm and 45nm parametric test structures. Pyramid Plus technology ensures a low cost of ownership, while delivering superior signal integrity and faster settling time, compared to traditional probe technologies.
Elite 300 Station Platform - The Next Step in 300mm Probing
The Elite 300 probe station sets the new standard for 300mm on-wafer test. Whether your application is RF/DC device characterization, Wafer-Level Reliability, or IC failure analysis and design debug, the Elite 300 probe station delivers the precision and versatility needed for complex on-wafer testing.
View: Elite 300 Station Platform - The Next Step in 300mm Probing
Tesla: On-Wafer Power Device Characterization System
Tesla is the industry’s first complete system for on-wafer power device characterization. Now power device manufacturers can take advantage of a complete on-wafer solution for over temperature, low-contact resistance measurements of power devices up to 60A and 3000V. Tesla is here to help power device manufacturers meet and beat the extraordinary pace of the global marketplace.
WinCal XE software for accurate and repeatable RF measurement
Unique in the wafer test market, only WinCal XE combines advanced calibration with RF accuracy enhancement features. Through powerful new measurement support tools and guidance systems that minimize operator mistakes, WinCal XE enables accurate and reliable RF measurements, a real problem with today’s complex semiconductor designs.
View: WinCal XE software for accurate and repeatable RF measurement
High current Infinity probe for power RF devices
Cascade Microtech Adds High-Current Model to Infinity Probe® Family - High-current RF probe with low contact resistance enables accurate on-wafer characterization of RF power devices
Infinity Probe for smaller RF devices through 220 GHz
Cascade Microtech’s New Infinity Probes® Enable Superior Wafer-Level RF Characterization of Smaller Devices Through 220 GHz. New Infinity RF wafer probes are ideal for probing fine pitch aluminum pads, ensuring low, stable contact resistance and minimal pad damage
Philips' MiPlaza research center partnership
Cascade Microtech Announces Partnership with Philips and Agilent Technologies to Establish New Research Facility for Development of Next Generation of High-speed Wireless Devices
