WinCal XE Software

WinCal XE reportWinCal XE enhances RF measurement accuracy and productivity through guided system setup, automatic calibration and validation, and other advanced RF measurement related tools.

Easy, Fast and Accurate RF Measurements

WinCal XE's Guides and Wizards guarantee trustworthy measurement results, by eliminating system setup errors, and automating calibration and validation.

New Calibration Algorithms

WinCal XE provides new probing tolerant calibration algorithms, and ensures easy and fast multiport measurements on up to 4 ports.

Quick and Easy Data Validation and Reporting

You can view your data in any format, without exporting or converting it.

New in WinCal XE Version 4.2 Service Pack 1

  • Support for programmable probe positioners enabling automated TRL and NIST-style multi-line TRL calibration
  • Improved 2nd tier calibration capability
  • Measurement sequencing (beta) enables virtually unlimited custom test sequencing and instrument control for simple test automation
  • Improved zoom and marker capabilities in data reporting
  • Enhanced remote commands
  • Simplified advanced calibrations when using external test-set Agilent PNA systems in 4-port mode

 

Related Web Pages
WinCal Support
WinCal Downloads
RF Parameter Extraction for Semiconductor Device Modeling
Multi-port/Differential Probing

Related Files
WinCal XE Software Brochure
WinCal XE Specification Sheet
Making Accurate and Reliable 4-port On-Wafer Measurement
A High Isolation Dual Signal Probe Technology
Solve complexity issues in 4-port RF designs
Optimized Impedance Standard Substrate Designs for Dual and Differential Applications
A Hybrid Probe-Tip Calibration for Multiport Vector Network Analyzers
Validation of On-Wafer Vector Network Analyzer Systems
VNA Calset Port Augmentation for Impedance Matching Probe Calibration