RF Quadrant Probes
Multiple configurations for functional circuit testing
Quadrant Probes were developed in response to the need for multiple probe tips in a single module. Configurations consist of all RF or a combination of RF and DC. The RF probes use Air Coplanar technology to produce a rugged microwave probe with a compliant tip for accurate, repeatable measurements on-wafer. The DC probes use ceramic blade needles for low noise and high performance.
Features
- Customized to customer application
- Mixture of DC and RF in one probe module
- Up to 3 RF
- Up to 8 DC
- Utilizes ACP tip design, GSG, GS or SG
- RF tips available from DC to 100 GHz
- Choice of BeCu or tungsten tips
- DC needles come with a 100 pF capacitor to ground at the needle base
Advantages
- Ideal for probing the entire circuit for functional test
- Dual ACP configuration supports differential signaling applications
- DC probes can provide power or slow logic to circuit under test
40/80 Gb/s High Performance RF Quadrant
Designed to provide wide bandwidth RF connections and simultaneous resonant free power bypass connections for the special needs of high-speed mixed mode IC s for optical networks.
- Low RF loss and excellent impedance control over very wide bandwidth
- High performance resonance free bypass for low impedance power supplies
- Allows on-wafer evaluation of high performance digital circuits
- Minimal distortion of high-speed digital signals
- Maximized eye diagram test performance at wafer test
- Durable Air Coplanar tip technology for long contact life
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