Eye-Pass Multicontact DC Probe

Durable multi-contact wafer probe with Eye-Pass controlled impedance power bypass technology

The multi-contact Eye-Pass probe provides controlled impedance power connections enabling functional testing of even the most challenging circuits on-wafer. The high-durability composite multi-finger tip provides high compliance and ensures precise alignment. This custom probe allows the user to select the footprint pattern best suited for the application, with up to 12 contacts per probe head. Available contact types are ground, logic, standard and Eye-Pass power supply, power supply sense, and ac signal.

Online Eye-Pass® Probe Design Capture and RFQ Form

 

Eye-Pass Probe: Durable multi-contact wafer probe with  power bypass technology
Features	Eye-Pass Probe
High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz RF bandwidth to 500 MHz Long probe life: > 250,000 contacts Flexible configuration; can mix ground, logic, power supply, ac signal, or power supply sense Up to 12 contacts per probe head Beryllium-copper tips for gold pads or tungsten for aluminum pads Single and ganged flexible coaxial assemblies available	Eye-Pass Datasheet
Advantages
Allows on-wafer evaluation of high-performance digital circuits Oscillation-free testing of wide-bandwidth analog circuits Use with ACP series probes to provide functional at-speed testing for known-good-die Long life for production testing Fully compatible with your existing Cascade Microtech probes and probe stations

Related Web Pages
Unity Probe ™: Multicontact probe for RFIC engineering test
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DC/CV Parameter Extraction for Semiconductor Device Modeling

Related Files
Eye-Pass Multicontact Power Bypass Probe Datasheet
RF Probe Selection Guide