DCP100 Series Probe Holder
DCP100 Series Probe Holder
The DCP100 Series Probe Holder delivers the measurement accuracy needed for advanced on-wafer process, device characterization and reliability testing. With superior guarding and shielding, these probes overcome the performance limitations of non-coaxial needle probes.
Features
- High-quality construction with low-noise electrical performance
- Kelvin version for convenient 4-point measurements
- Choice of tip radii
- SSMC 50 connectors
- Replaceable coaxial probe tips
Advantages
- Ultra-low, fA and fF measurements from -65 º C to 150 º C
- Full electrical guard to the probe tip
- Integrally designed as part of Cascade's complete measurement solution
- Highly reliable, stable and repeatable
