DC Parametric Probes
Cascade Microtech's DC probes deliver highly accurate measurements for advanced on-wafer process, device characterization and reliability testing. Our probes offer superior guarding and shielding over-temperature to resolve the performance limitations of non-coaxial and standard coaxial probes.
DCP100 Series Probe Holder
The DCP100 Series Probe Holder delivers the measurement accuracy needed for advanced on-wafer process, device characterization and reliability testing. With superior guarding and shielding, these probes overcome the performance limitations of non-coaxial needle probes.
DCP-HTR High performance DC Probe Holder
The DCP-HTR probe holder delivers fA-level measurement capability from -65°C to 300°C for state-of-the-art reliability testing. Its unique design offers superior guarding and shielding over-temperature, overcoming the high-temperature performance limitations of standard coaxial needles.
| Related Web Pages |
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| DC/CV Parameter Extraction for Semiconductor Device Modeling |
| Flicker Noise Analysis (1/f) |
| Failure Analysis/Design Debug |
| Related Files |
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| DCP-HTR High performance DC Probe Holder |
| DCP 100-Series Probes Precision DC Coaxial Microprobes |
