DC Probes
Cascade Microtech's DC probes deliver highly accurate measurements for advanced on-wafer process, device characterization and reliability testing. Our probes offer superior guarding and shielding over-temperature to resolve the performance limitations of non-coaxial and standard coaxial probes.
DCP100 Series Probe Holder
The DCP100 Series Probe Holder delivers the measurement accuracy needed for advanced on-wafer process, device characterization and reliability testing. With superior guarding and shielding, these probes overcome the performance limitations of non-coaxial needle probes.
DCP-HTR High performance DC Probe Holder
The DCP-HTR probe holder delivers fA-level measurement capability from -65°C to 300°C for state-of-the-art reliability testing. Its unique design offers superior guarding and shielding over-temperature, overcoming the high-temperature performance limitations of standard coaxial needles.
Eye-Pass Multicontact DC Probe
The multicontact Eye-Pass probe provides controlled impedance power connections enabling functional testing of even the most challenging circuits on-wafer. The high-durability composite multi-finger tip provides high compliance and ensures precise alignment. This custom probe allows the user to select the footprint pattern best suited for the application, with up to 12 contacts per probe head.
Multicontact DC Power Probe Series
Multi-contact DC power probes were developed in response to the need for multiple probe tips in a single probe head. The DCQ probes use controlled impedance, ceramic blade needles for low noise and high performance. This needle style allows the placement of high quality bypass capacitors with very little series inductance due to their close proximity to the probe tip. All of the needles are connected to a common ground plane but individual needles can be easily (ground) isolated for additional low noise performance.
High Current Parametric (HCP) Probe
Designed specifically for testing power devices on wafer, the High Current Parametric Probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
High Voltage Parametric (HVP) Probe
Cascade Microtech’s High Voltage Parametric Probe provides the capability to make coaxial measurements up to 3000V and triaxial measurements up to 1100V while preserving a low-noise measurement path. The HVP probe is engineered with proprietary insulation materials that prevent against dielectric breakdown to enable low leakage measurements as low as 100fA at high voltage (1100V).
| Related Web Pages |
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| DC/CV Parameter Extraction for Semiconductor Device Modeling |
| Flicker Noise Analysis (1/f) |
| Failure Analysis/Design Debug |
| Related Files |
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| DCP-HTR High performance DC Probe Holder |
| DCP 100-Series Probes Precision DC Coaxial Microprobes |
