Integrated Systems
Highly Optimized System Products solve complex measurement challenges
Integrated systems from Cascade Microtech provide a complete solution for complex measurement problems that cannot be solved with just a collection of piece parts. Each part of the integrated solution is optimized and fine tuned to work together, enabling fast accurate on-wafer data collection for complex application and measurement needs. Integrated Systems are build upon high performance Cascade Microtech probe stations, giving you the ease of use and full featured on-wafer probing experience that has made Cascade Probe Station's the #1 choice of customer throughout the world. And each turnkey solution includes everything you need in one system, including a variety of highly optimized on-wafer probes, test instrumentation & cabling configurations, and software tools, ready to go.
EDGE: Fully Integrated Flicker Noise Measurement System
The EDGE™ Flicker Noise Measurement System is the world’s only fully integrated, noise-immune measurement system that certifies accurate flicker noise measurements from 1 Hz to 30 MHz. The EDGE delivers new levels of certainty to companies that must continue to improve device performance, increase yield, command higher margins and reduce time to market.
View: EDGE: Fully Integrated Flicker Noise Measurement System
Tesla: On-Wafer Power Device Characterization System
Tesla is the industry’s first complete system for on-wafer power device characterization. Now power device manufacturers can take advantage of a complete on-wafer solution for over temperature, low-contact resistance measurements of power devices up to 60A and 3000V. Tesla is here to help power device manufacturers meet and beat the extraordinary pace of the global marketplace.
