WinCal XE software for accurate and repeatable RF measurement

Faster and More Accurate Wafer-level RF Measurement Enabled by New WinCal XE Software From Cascade Microtech

Unique in the wafer test market, only WinCal XE combines advanced calibration with RF accuracy enhancement features. Through powerful new measurement support tools and guidance systems that minimize operator mistakes, WinCal XE enables accurate and reliable RF measurements, a real problem with today’s complex semiconductor designs.

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