Pyramid P30 RF Filter/Switch Probe Cards

Cascade Microtech’s New P30 Pyramid Probe® Production Probe Card Lowers Cost of High-Volume Wafer Testing of RF Switches and Filters

To address the critical need to reduce the cost of high-volume testing of RF devices for the mobile handset market, Cascade Microtech today introduced a new Pyramid Probe card that brings high performance RF production test capability with over 50% cost-of-ownership savings over current approaches.

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