200mm Probe Stations
Cascade Microtech’s industry standard 200 mm wafer probing systems are in use at virtually all leading semiconductor manufacturing and design sites worldwide. They have been designed to allow access the full measurement range of today’s most advanced test instrumentation. Whatever the application - device characterization, modeling, process development, design de-bug or IC failure analysis, Cascade Microtech probing systems have the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices.
Summit 11000/12000 Probe Stations
Cascade Microtech 11000 and 12000 series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization,wafer-level reliability, e-test, modeling, or yield enhancement, the 11000 series manual or 12000 series probe stations assure best-in the-world measurements.
R48/R61 Failure Analysis & General Purpose Systems
Flexible and affordable the REL-6100 and REL-4800 Series Parametric Probe Stations combine precision sub-micron probing capability needed for IC failure analysis and design de-bug. Sub-micron resolution, precise motion control, and 8-inch travel.
| Related Web Pages |
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| PureLine Technology |
| Related Files |
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| Wafer-level reliability measurements speed your time to accurate results |
| Summit Series Station Ordering Information |
| 200mm Manual and Semiautomatic Probe Stations |
