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New Calibration Solutions for Multi-Channel Probes using an Added Port for Thru Measurements

A new method is proposed for calibrating multichannel probes placed in multiple quadrants for wafer or chip level measurement. It uses an additional ground-signal-ground probe to enable thru measurements in a conventional calibration procedure, avoiding the need for custom calibration kits. The inherent delay inconsistencies in the proposed method are shown to be small enough to have minimal effects on the measurement uncertainties, in most practical cases.

New Calibration Solutions for Multi-Channel Probes using an Added Port for Thru Measurements

Created: August 23, 2017 | Updated: August 23, 2017 | Type: pdf | Size: 149.78 KB

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