Join us at SEMICON China 2015

Cascade Microtech will be at SEMICON China March 17th through the 19th. We will be showcasing our a number of probing solutions.
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Modular, Manual 150 mm Probe System for Application-Focused Probing Solutions

The EPS 150 is a very cost-effective and easy to use, highly-precise manual probe system for wafers and substrates up to 150 mm that supports a wide variety of applications.
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Velox™ Probe Station Control Software – Video Tutorials

Check out the tutorial videos for our new Velox probe station control software and see the new functionality and increased productivity within your reach.
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Removing Risk from Used IC Equipment Purchasing

Buying used test and measurement equipment does not have to be risky. Cascade Microtech has removed the risk from used equipment purchases.
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Introducing Velox™ 2.0 – New Probe Station Control Software

Cascade Microtech has new probe station control software - Velox 2.0 - that is designed to meet growing demand for test and measurement efficiency to accelerate time to job completion.
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Hybrid Calibration for 4-Port On-Wafer Probing

For 4-port calibration we have combined the widely accepted LRRM calibration with the short-open-load-reciprocal thru (SOLR) calibration. Read our blog for more.
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IoT is Set to Transform the Semiconductor Test Industry

The promise of IoT is leading a path directly through the semiconductor test industry, with needs that are sure to result in developments and growth.
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Happy Holidays from Cascade Microtech!

All of us at Cascade Microtech wish you a safe, happy Holiday and New Year! Here is a short recap of 2014.
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