CONNECT – Join Us at a City Near You

We will be presenting our latest on-wafer probing solutions that address your measurement and test challenges at a CONNECT city soon.
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COMPASS 2014 – Speakers Announced

COMPASS 2014, the Cascade Microtech annual users conference, announces the line up of speakers for this years event.
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Terahertz Probes – High-Accuracy Measurement from 220 GHz through 1.1 THz

The new Cascade Microtech T-Wave probe provides high-accuracy measurement from 220 GHz through 1.1 THz. Read our latest blog.
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Come See Us at MEMUNITY’s MEMS Testing and Metrology Workshop at SEMICON Europa

Cascade Microtech is sponsoring Memunitys MEMS Testing and Metrology Workshop at SEMICON Europa in October. Read our blog for details.
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COMPASS 2014 – Agenda and Program Sneak Peak

The second annual Cascade Microtech users conference - COMPASS - is coming in early October. Here is a sneak peak of the agenda and program.
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New Ultra High-Power (UHP) Probe: Expanding Power Device Solutions

The new Ultra High-Power (UHP) probe, coupled with new thermal chuck capabilities, supports testing at both high current and high voltage with one contact.
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Copper Pillars versus Solder Balls – The Substrate’s About to Change

Moving from solder balls to copper pillars can affect probe resistance. Read our latest blog post for some thoughts on where this is headed.
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New Calibration Solutions for Multi-Channel Probes

A new method is proposed for calibrating multichannel probes placed in multiple quadrants for wafer or chip level measurement. Read our latest blog.
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