Introducing MeasureOne™ – A Solutions Program for Faster Time to Market

MeasureOne is a new solutions program enabling Cascade Microtech customers to experience accelerated time to market through faster time to first measurement.
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Agilent Technologies and Cascade Microtech: Alliance Streamlines Wafer-Level Measurements

Cascade Microtech and Agilent Technologies are teaming up to provide streamlined wafer-level measurement solutions. Read our latest blog post.
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Cascade Microtech Wins American Technology Award for APS200TESLA

Cascade Microtech wins American Technology Award in the semiconductor and electronic components category.
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COMPASS 2014 – Call for Papers

Cascade Microtech COMPASS 2013 users conference announces final call for papers. Here is what we are looking for and how to submit.
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Probing 50 µm and 40 µm Pitch Bumps

Cascade Microtech CM300 on-wafer probe station allows you to cost-effectively probe pitch bumps.
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CM300 Probe System – Best in Test – 2014 Award Winner

CM300 Probe System was just named winner in EDNs Best-in-Test awards semiconductor category beating out three other strong contenders.
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Cascade Microtech on the Road in May and June

Cascade Microtech is on the road this May and June attending semiconductor events in Denver, Tampa Bay and Germany. Stop by and say hello!
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Michael Burger – 2014 Oregon Technology Executive of the Year

Our own CEO, Michael Burger, has been named the 2014 Oregon Technology Executive of the Year.
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