Probing 50 µm and 40 µm Pitch Bumps

Cascade Microtech CM300 on-wafer probe station allows you to cost-effectively probe pitch bumps.
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CM300 Probe System – Best in Test – 2014 Award Winner

CM300 Probe System was just named winner in EDNs Best-in-Test awards semiconductor category beating out three other strong contenders.
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Cascade Microtech on the Road in May and June

Cascade Microtech is on the road this May and June attending semiconductor events in Denver, Tampa Bay and Germany. Stop by and say hello!
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Michael Burger – 2014 Oregon Technology Executive of the Year

Our own CEO, Michael Burger, has been named the 2014 Oregon Technology Executive of the Year.
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Four Pyramid Probe Card Cleaning Methods to Avoid

Getting the most out of your Pyramid Probe Cards depends a lot on how you clean them. Here are 4 cleaning methods to avoid.
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Probing 25 μm-diameter Micro-bumps for Wide-I/O 3D SICs

Recent breakthroughs in probing technology now allow probing of bumps below 50 μm pitch. Read our latest blog and check out the article in Chip Scale Review.
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Join Us at SEMICON China in March

Cascade Microtech will be displaying a number of cutting edge probing solutions at SEMICON China in March. Join us!
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Four Online Cleaning Recommendations for Pyramid Probe Cards

Getting the most out of your Pyramid Probe Cards depends a lot on how you clean them. Here are 4 online cleaning methods we would recommend.
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