COMPASS 2014 – Agenda and Program Sneak Peak

The second annual Cascade Microtech users conference - COMPASS - is coming in early October. Here is a sneak peak of the agenda and program.
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New Ultra High-Power (UHP) Probe: Expanding Power Device Solutions

The new Ultra High-Power (UHP) probe, coupled with new thermal chuck capabilities, supports testing at both high current and high voltage with one contact.
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Copper Pillars versus Solder Balls – The Substrate’s About to Change

Moving from solder balls to copper pillars can affect probe resistance. Read our latest blog post for some thoughts on where this is headed.
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New Calibration Solutions for Multi-Channel Probes

A new method is proposed for calibrating multichannel probes placed in multiple quadrants for wafer or chip level measurement. Read our latest blog.
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COMPASS 2014 – Registration is Now Open

COMPASS 2014, the Cascade Microtech users conference, is now open for registration. Join us October 9-10 at the Hilton Rome Airport in Rome, Italy.
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Pyramid Probe Cards: Online Cleaning Frequency vs. Trade-offs

Getting the most out of your Pyramid Probe Cards depends a lot on the frequency you clean them. Here are some tips to help you understand the trade-offs.
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3DInCites in the 3D Test Lab at imec

Francoise von Trapp tours the 3D test lab at imec and gets a demo of the CM300 probe station.
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Introducing MeasureOne™ – A Solutions Program for Faster Time to Market

MeasureOne is a new solutions program enabling Cascade Microtech customers to experience accelerated time to market through faster time to first measurement.
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