Come See Us at MEMUNITY’s MEMS Testing and Metrology Workshop at SEMICON Europa

Cascade Microtech is sponsoring Memunitys MEMS Testing and Metrology Workshop at SEMICON Europa in October. Read our blog for details.
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COMPASS 2014 – Agenda and Program Sneak Peak

The second annual Cascade Microtech users conference - COMPASS - is coming in early October. Here is a sneak peak of the agenda and program.
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New Ultra High-Power (UHP) Probe: Expanding Power Device Solutions

The new Ultra High-Power (UHP) probe, coupled with new thermal chuck capabilities, supports testing at both high current and high voltage with one contact.
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Copper Pillars versus Solder Balls – The Substrate’s About to Change

Moving from solder balls to copper pillars can affect probe resistance. Read our latest blog post for some thoughts on where this is headed.
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New Calibration Solutions for Multi-Channel Probes

A new method is proposed for calibrating multichannel probes placed in multiple quadrants for wafer or chip level measurement. Read our latest blog.
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COMPASS 2014 – Registration is Now Open

COMPASS 2014, the Cascade Microtech users conference, is now open for registration. Join us October 9-10 at the Hilton Rome Airport in Rome, Italy.
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Pyramid Probe Cards: Online Cleaning Frequency vs. Trade-offs

Getting the most out of your Pyramid Probe Cards depends a lot on the frequency you clean them. Here are some tips to help you understand the trade-offs.
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3DInCites in the 3D Test Lab at imec

Francoise von Trapp tours the 3D test lab at imec and gets a demo of the CM300 probe station.
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