Happy Holidays from Cascade Microtech!

All of us at Cascade Microtech wish you a safe, happy Holiday and New Year! Here is a short recap of 2014.
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Wrapping Up COMPASS 2014

COMPASS 2014 was a great success! Check out the conference highlights and register for notifications to COMPASS 2015 next September in Boston.
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Cascade Microtech Celebrates 10 Years on Nasdaq

We will be visiting the Nasdaq MarketSite in Times Square in celebration of our 10 year anniversary of listing on The Nasdaq Stock Market.
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ACP Wave Guide RF On-wafer Probe Featured in Wireless Design & Development

The Cascade Microtech ACP Wave Guide on-wafer probe was recently featured in an article in Wireless Design & Development. Check it out!
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Three Features to Look for in a Reliability Test System

When selecting a reliability test system, these three features provide must-have benefits. Read our blog for details.
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Wafer Probing on Fine-Pitch Micro-Bumps for 2.5D and 3D-SICs

Wafer probing on fine-pitch micro-bumps for 2.5D- and 3D-SICs requires advanced probe technology. See some recent research with IMEC.
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Keysight Technologies Joins our MeasureOne™ Best-of-Breed Solutions Program

Our MeasureOne best-of-breed IC test and measure solution welcomes a new partner Keysight Technologies. Check out our blog for details.
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Six Challenges with Small Pad Probing

Here are six challenges with small pad probing, all of which are solvable with the InfinityQuad multi-contact probe.
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