Introducing Velox™ 2.0 – New Probe Station Control Software

Cascade Microtech has new probe station control software - Velox 2.0 - that is designed to meet growing demand for test and measurement efficiency to accelerate time to job completion.
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Hybrid Calibration for 4-Port On-Wafer Probing

For 4-port calibration we have combined the widely accepted LRRM calibration with the short-open-load-reciprocal thru (SOLR) calibration. Read our blog for more.
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IoT is Set to Transform the Semiconductor Test Industry

The promise of IoT is leading a path directly through the semiconductor test industry, with needs that are sure to result in developments and growth.
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Happy Holidays from Cascade Microtech!

All of us at Cascade Microtech wish you a safe, happy Holiday and New Year! Here is a short recap of 2014.
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Wrapping Up COMPASS 2014

COMPASS 2014 was a great success! Check out the conference highlights and register for notifications to COMPASS 2015 next September in Boston.
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Cascade Microtech Celebrates 10 Years on Nasdaq

We will be visiting the Nasdaq MarketSite in Times Square in celebration of our 10 year anniversary of listing on The Nasdaq Stock Market.
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ACP Wave Guide RF On-wafer Probe Featured in Wireless Design & Development

The Cascade Microtech ACP Wave Guide on-wafer probe was recently featured in an article in Wireless Design & Development. Check it out!
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Three Features to Look for in a Reliability Test System

When selecting a reliability test system, these three features provide must-have benefits. Read our blog for details.
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