COMPASS 2014 – Registration is Now Open

COMPASS 2014, the Cascade Microtech users conference, is now open for registration. Join us October 9-10 at the Hilton Rome Airport in Rome, Italy.
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Pyramid Probe Cards: Online Cleaning Frequency vs. Trade-offs

Getting the most out of your Pyramid Probe Cards depends a lot on the frequency you clean them. Here are some tips to help you understand the trade-offs.
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3DInCites in the 3D Test Lab at imec

Francoise von Trapp tours the 3D test lab at imec and gets a demo of the CM300 probe station.
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Introducing MeasureOne™ – A Solutions Program for Faster Time to Market

MeasureOne is a new solutions program enabling Cascade Microtech customers to experience accelerated time to market through faster time to first measurement.
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Agilent Technologies and Cascade Microtech: Alliance Streamlines Wafer-Level Measurements

Cascade Microtech and Agilent Technologies are teaming up to provide streamlined wafer-level measurement solutions. Read our latest blog post.
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Cascade Microtech Wins American Technology Award for APS200TESLA

Cascade Microtech wins American Technology Award in the semiconductor and electronic components category.
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COMPASS 2014 – Call for Papers

Cascade Microtech COMPASS 2013 users conference announces final call for papers. Here is what we are looking for and how to submit.
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Probing 50 µm and 40 µm Pitch Bumps

Cascade Microtech CM300 on-wafer probe station allows you to cost-effectively probe pitch bumps.
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