Convenience: A 150mm Manual Application-Specific Probe System

A 150mm manual application-specific probe system pre-configured for specific measurement applications provides convenience along with accurate measurement repeatability. Read our blog to learn more.
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Fully-Automatic On-Wafer Probe Station

The APS200TESLA is the first fully-automatic on-wafer probe station for high-power device production test, providing higher margins and a shorter time-to-market. Read our blog and see the video demo.
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Kudos to our Employee Innovators

From on-wafer power device characterization systems to configurable quadrant probes there are many firsts at Cascade Microtech, thanks in part to our employee innovators. This year we honored 42 in the US and 32 abroad. Read our blog to learn more.
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New Versatile and Affordable Probe Card Solution

We have recently launched a new, affordable and versatile probe card solution (QuadCard) that can help save money and speed time-to-market. Read our blog to learn more.
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Onsite Measurement of RF Probe Insertion Loss

A step-by-step process for measuring the insertion loss of RF probes onsite using Cascade Microtech WinCal XE software.
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On-Wafer Calibration – Two Frequently Asked Questions

This blog addresses two common questions surrounding on-wafer calibration. Visit the blog to learn more.
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Upper Frequency Recommendations for Various RF Probes and Pitches

Various RF probes and pitches require different upper frequencies. Determining these frequencies is a matter of following smart rules of thumb. Read our blog to see how we calculate these frequencies.
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Special Sneak-Peek at IMS/MTT-S in Montreal – June 19th

At the International Microwave Symposium on June 19th in Montreal, Cascade Microtech will provide a sneak-peek of two exciting new products. Read our blog to learn more.
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