7 Solvable Small Pad Probing Challenges

Our new InfinityQuad multi-contact probe successfully addresses common small pad probing challenges. Here are 7 of those challenges.
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Expanding Device Characterization Performance and Productivity

Our Infinity Probe and related wafer probe station solutions are expanding device characterization performance and productivity through a host of features.
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Factors Impacting Wafer-Level Test Productivity

Wafer-level test productivity can be hindered especially when performing unattended testing over multiple temperatures. This blog discusses 4 of these productivity drains and introduces a new PTPA correction technology to overcome them.
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Four-Step Process for Pyramid Probe Card Core Off-Line Cleaning

To protect your investment, prevent probing errors and avoid device damage, be sure to carefully follow the four-step cleaning process described here for the off-line cleaning of your Pyramid Probe core
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Achieving Accurate, Wafer-Level Power Device Characterization

Achieving accurate, wafer-level power device characterization is not easy with the advancements of technology. Our Tesla system addresses 5 challenges today that can help overcome this obstacle.
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New Research Paper – Scalable RFCMOS Model for 90 nm Technology

We just got our new research paper, Scalable RFCMOS Model for 90nm Technology, published by the International Journal of Microwave Science and Technology.
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Join Us at SEMICON Korea February 7th through the 9th

Visit the Cascade Microtech booth at SEMICON Korea from February 7th to the 9th and learn more about our new InfinityQuad probe as well as the industrys leading power device measurement system, Tesla.
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Hybrid, On-Wafer Calibration for 4-Port: The Best of LRRM and SOLR

A combination of LRRM cal with the short-open-load-reciprocal thru (SOLR) cal, creates a hybrid cal that takes advantage of the strengths of both calibration methods for a superior 4-port calibration.
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