BCTM Paper: State-of-the-Art in Calibration and De-Embedding Techniques

Join us at the IEEE Bipolar/BICMOS Circuits and Technology Meeting in Portland, Oregon this September, where we will present a new paper that presents an overview of RF calibration and pad de-embedding techniques, among other things.
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Mixed-Signal, Small Pad Probing Up to 110 GHz

Small pad probing is a reality today. See the video demonstration of the InfinityQuad probe, capable of probing the smallest probing pads.
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2 New App Notes: Parameter Extraction and Probe Calibration

We have two new papers available that cover parameter extraction for advanced RF devices and SOLT/SOLR Calibration with InfinityQuad probes.
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New Power Device Characterization and Measurement Solutions

If you are in the industry or academia, working with high power device characterization and measurement at the wafer-level, then this free webinar is something you should see. Read our blog to learn more.
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Convenience: A 150mm Manual Application-Specific Probe System

A 150mm manual application-specific probe system pre-configured for specific measurement applications provides convenience along with accurate measurement repeatability. Read our blog to learn more.
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Fully-Automatic On-Wafer Probe Station

The APS200TESLA is the first fully-automatic on-wafer probe station for high-power device production test, providing higher margins and a shorter time-to-market. Read our blog and see the video demo.
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Kudos to our Employee Innovators

From on-wafer power device characterization systems to configurable quadrant probes there are many firsts at Cascade Microtech, thanks in part to our employee innovators. This year we honored 42 in the US and 32 abroad. Read our blog to learn more.
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New Versatile and Affordable Probe Card Solution

We have recently launched a new, affordable and versatile probe card solution (QuadCard) that can help save money and speed time-to-market. Read our blog to learn more.
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