Expanding our Reliablity Test Solutions

We just announced an acquisition that builds our portfolio of wafer-level reliability test solutions. Read our latest blog post for details.
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COMPASS 2013 – Keynote Speaker Announced

Take advantage of all that COMPASS 2013 has to offer, and see a fabulous keynote address on future trends in semiconductor packaging and the impact of test. Register today!
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Breakthrough in Probing Stacked Integrated Circuits (3D-SICs)

Together with imec, we successfully probed 25 µm-diameter micro-bumps on a wide I/O test wafer with our fully-automated CM300 probe solution.
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COMPASS 2013 – Registration is Now Open

Take advantage of all that COMPASS 2013 has to offer, including spectacular engineering and production speakers and the chance to network with peers. Register today!
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LED Wafer Testing with Integrating Spheres

With the growing success of sold state lighting and LED, wafer testing needs to become more standardized. Read our latest blog on how integrating spheres helps.
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COMPASS – Cascade Microtech 2013 Annual User Group Meeting and Call for Papers

The Cascade Microtech annual user group meeting is coming in September. Submit an abstract to present and be part of the show. Check back for details.
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XpressQuote – Instant Single- or Dual-Signal RF Probe Online Data

The new XpressQuote online tool from Cascade Microtech helps save valuable time in the purchasing of RF probes. Read our latest blog post to learn more.
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Cascade Microtech at No. 4 on Seattle Times ‘Best of the Northwest’

A recent Seattle Times article highlighted Cascade Microtech as the No. 4 public company on their 22nd Annual Best of the Northwest list! Here are the highlights!
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