Kudos to our Employee Innovators

From on-wafer power device characterization systems to configurable quadrant probes there are many firsts at Cascade Microtech, thanks in part to our employee innovators. This year we honored 42 in the US and 32 abroad. Read our blog to learn more.
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New Versatile and Affordable Probe Card Solution

We have recently launched a new, affordable and versatile probe card solution (QuadCard) that can help save money and speed time-to-market. Read our blog to learn more.
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Onsite Measurement of RF Probe Insertion Loss

A step-by-step process for measuring the insertion loss of RF probes onsite using Cascade Microtech WinCal XE software.
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On-Wafer Calibration – Two Frequently Asked Questions

This blog addresses two common questions surrounding on-wafer calibration. Visit the blog to learn more.
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Upper Frequency Recommendations for Various RF Probes and Pitches

Various RF probes and pitches require different upper frequencies. Determining these frequencies is a matter of following smart rules of thumb. Read our blog to see how we calculate these frequencies.
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Special Sneak-Peek at IMS/MTT-S in Montreal – June 19th

At the International Microwave Symposium on June 19th in Montreal, Cascade Microtech will provide a sneak-peek of two exciting new products. Read our blog to learn more.
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Join Us at Upcoming Events in June

From RF calibration to WinCal to wafer test workshops, June is a busy event month for us. If you are at one of these events, be sure to swing by.
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Understanding Different On-Wafer Calibration Values with SOLT vs. LRRM

On-wafer calibration values can differ with SOLT versus LRRM when using WinCal for calibration measurement. This is normal and this blog explains why.
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