Tesla On-Wafer Probing – Three Common Questions

Three common questions regarding the Tesla on-wafer probing system along with the supporting answers. Read our blog to learn more.
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Wafer-Level RF MEMS Device Characterization in a Cryogenic Environment

Extending the capability of conventional wafer-level probing methodology to extreme environmental conditions is a crucial requirement of both development and manufacturing of RF MEMS devices.
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Challenges with Aluminum Pad Probing

An RF Prober often runs into challenges with aluminum pad probing, and this blog addresses some of those challenges. The Infinity Probe was created to address these and other challenges.
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Protecting Wafer Probe Total Cost of Ownership (TCO)

Cascade Microtech has launched a wafer probe repair program to help you maximize your investment and ROI. Check out the program details here.
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Join us in Anaheim at the International Reliability Physics Symposium (IRPS)

Cascade Microtech will be exhibiting at IRPS (International Reliability Physics Symposium) in Anaheim on April 17-19.
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What are the VNA On-Wafer Calibration Coefficients for my ISS?

This question may indicate a basic misunderstanding of on-wafer calibration. A simple answer is in the table provided, however, a more advanced answer follows.
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When Advanced RF Calibration is the Answer

Advanced RF calibration may be needed when using probes for device characterization or process monitoring. This blog addresses this potential need.
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7 Solvable Small Pad Probing Challenges

Our new InfinityQuad multi-contact probe successfully addresses common small pad probing challenges. Here are 7 of those challenges.
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