Protect your probe card and probe card investment by following the proper cleaning methods. Here’s what we recommend for our Pyramid Probe Card.
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We’ll be presenting with IMEC at SEMICON’s European Manufacturing Test Conference in October on wafer probing on fine-pitch micro-bumps. Come join us October 11th through the 13th.
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On-wafer calibration is the most suitable approach for accurate characterization of the high-speed silicon-based devices at mm-wave wave range.
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LED Manufacturers need to lower their cost of test to stay competitive and wafer-level LED test is one area that can help significantly.
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When wafer level test is the final test for a product, the electrical performance of the contactor needs to be understood so that a high level of signal integrity can be maintained
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Precision 4-port on wafer probe measurement relies on proper selection of system elements. Here we address some challenges to 4-port on wafer measurements.
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What is needed to drive down the cost of LED lighting? Simply put, LED test processes such as wafer level packaging and testing improvements and efficiencies.
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System calibration is critical to getting accurate measurement data from RF wafer devices. See why in this most recent post on 4-Port On-Wafer measurement.
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