Join Us at Upcoming Events in June

From RF calibration to WinCal to wafer test workshops, June is a busy event month for us. If you are at one of these events, be sure to swing by.
[View More]

Understanding Different On-Wafer Calibration Values with SOLT vs. LRRM

On-wafer calibration values can differ with SOLT versus LRRM when using WinCal for calibration measurement. This is normal and this blog explains why.
[View More]

Wafer Probing – Three More Frequently Asked Questions

Here are three questions - and answers - we see asked often about wafer probes. Visit our blog to learn more and explore other common probing, probe systems, and probe card questions.
[View More]

Techniques for Validating a VNA Calibration with Microwave Probes

Using microwave probes? This short presentation discusses ways to validate your VNA calibration so that your measurements will be accurate.
[View More]

Tesla On-Wafer Probing – Three Common Questions

Three common questions regarding the Tesla on-wafer probing system along with the supporting answers. Read our blog to learn more.
[View More]

Wafer-Level RF MEMS Device Characterization in a Cryogenic Environment

Extending the capability of conventional wafer-level probing methodology to extreme environmental conditions is a crucial requirement of both development and manufacturing of RF MEMS devices.
[View More]

Challenges with Aluminum Pad Probing

An RF Prober often runs into challenges with aluminum pad probing, and this blog addresses some of those challenges. The Infinity Probe was created to address these and other challenges.
[View More]

Protecting Wafer Probe Total Cost of Ownership (TCO)

Cascade Microtech has launched a wafer probe repair program to help you maximize your investment and ROI. Check out the program details here.
[View More]