Performing Accurate Wafer-Level TRL Calibration

Performing accurate wafer-level TRL calibration can be a necessary but time-consuming step, but with WinCal XE RF calibration software it just got easier. Read our blog to see how.
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3 Key Features of the APS200TESLA On-Wafer Probe System

The APS200TESLA on-wafer probe system is an industry first, but the three key features are what make this fully-automatic, on-wafer probe station unique. Read our blog to learn more.
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BCTM Paper: State-of-the-Art in Calibration and De-Embedding Techniques

Join us at the IEEE Bipolar/BICMOS Circuits and Technology Meeting in Portland, Oregon this September, where we will present a new paper that presents an overview of RF calibration and pad de-embedding techniques, among other things.
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Mixed-Signal, Small Pad Probing Up to 110 GHz

Small pad probing is a reality today. See the video demonstration of the InfinityQuad probe, capable of probing the smallest probing pads.
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2 New App Notes: Parameter Extraction and Probe Calibration

We have two new papers available that cover parameter extraction for advanced RF devices and SOLT/SOLR Calibration with InfinityQuad probes.
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New Power Device Characterization and Measurement Solutions

If you are in the industry or academia, working with high power device characterization and measurement at the wafer-level, then this free webinar is something you should see. Read our blog to learn more.
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Convenience: A 150mm Manual Application-Specific Probe System

A 150mm manual application-specific probe system pre-configured for specific measurement applications provides convenience along with accurate measurement repeatability. Read our blog to learn more.
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Fully-Automatic On-Wafer Probe Station

The APS200TESLA is the first fully-automatic on-wafer probe station for high-power device production test, providing higher margins and a shorter time-to-market. Read our blog and see the video demo.
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