SELECTShip™ – Taking the Headaches out of Your Equipment Shipping Needs

SELECTShip is a new semiconductor testing equipment delivery and shipping service from Cascade Microtech, designed to streamline your logistics. Read our blog for more on this new program.
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Pyramid Probe Cards – The Importance of Transmission Line Models

When using our Pyramid Probe Cards, transmission line modeling information is useful for impedance matching the device under test (DUT) to a particular load, or to predict the insertion loss of the overall assembly. Read our blog to learn more.
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Cascade Microtech… On the Road Again

Cascade Microtech will be attending and exhibiting a several APAC events at the end of November. Read our blog to see where we will be.
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4 Wafer Probe to Pad Alignment (PTPA) Errors that Impact Test Productivity

An overview of four wafer probe to pad alignment (PTPA) errors that impact semiconductor test productivity.
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Which Probe Tip Calibration is Best for Active Device Characterization?

We evaluated three probe tip calibration methods for active device characterization to determine which was best. Read our blog to see what we found.
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Device Characterization at the Sub-THz Range

Conventional device characterization techniques are challenged at the sub-THz range, but we have found a calibration method that works suitably. Read our blog to learn more.
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Strengths & Limitations of the SOLR Wafer Level S-Parameter Calibration Technique

Just how poorly can the Thru behave and still achieve an acceptable RF calibration? How much return loss, how much insertion loss can be tolerated? Read to find out...
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Recognizing and Diagnosing Poor Wafer-Level S-Parameter Calibrations

We know what causes poor wafer-level S-parameter calibrations, but how do you recognize and diagnose these calibrations. Read our blog to learn more and access a presentation that shows you how.
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