Which Probe Tip Calibration is Best for Active Device Characterization?

We evaluated three probe tip calibration methods for active device characterization to determine which was best. Read our blog to see what we found.
[View More]

Device Characterization at the Sub-THz Range

Conventional device characterization techniques are challenged at the sub-THz range, but we have found a calibration method that works suitably. Read our blog to learn more.
[View More]

Strengths & Limitations of the SOLR Wafer Level S-Parameter Calibration Technique

Just how poorly can the Thru behave and still achieve an acceptable RF calibration? How much return loss, how much insertion loss can be tolerated? Read to find out...
[View More]

Recognizing and Diagnosing Poor Wafer-Level S-Parameter Calibrations

We know what causes poor wafer-level S-parameter calibrations, but how do you recognize and diagnose these calibrations. Read our blog to learn more and access a presentation that shows you how.
[View More]

Performing Accurate Wafer-Level TRL Calibration

Performing accurate wafer-level TRL calibration can be a necessary but time-consuming step, but with WinCal XE RF calibration software it just got easier. Read our blog to see how.
[View More]

3 Key Features of the APS200TESLA On-Wafer Probe System

The APS200TESLA on-wafer probe system is an industry first, but the three key features are what make this fully-automatic, on-wafer probe station unique. Read our blog to learn more.
[View More]

BCTM Paper: State-of-the-Art in Calibration and De-Embedding Techniques

Join us at the IEEE Bipolar/BICMOS Circuits and Technology Meeting in Portland, Oregon this September, where we will present a new paper that presents an overview of RF calibration and pad de-embedding techniques, among other things.
[View More]

Mixed-Signal, Small Pad Probing Up to 110 GHz

Small pad probing is a reality today. See the video demonstration of the InfinityQuad probe, capable of probing the smallest probing pads.
[View More]